| Name
| Author
| Scientific journal
| Year
|
|
| Energy Sensitive X-Ray Imaging with Pixel Stack Detector
| Žemlička J.
; Jakůbek J.
; Soukup P.
| Engineering Mechanics Conference proceedings, Svratka, Czech Rep., Paper #310, pp. 721–727
| 2012
|
|
| Characterization of Charge Collection in Various Semiconductor Sensors with Energetic Protons and Timepix Device
| Platkevič M.
; Čermák P.
; Jakůbek J.
; Pospíšil S.
; Štekl I.
; Vykydal Z.
; Žemlička J.
; Leroy C.; Allard P.; Bergeron G.; Soueid P.; Teyssier C.; Yapoudjian R.; Fiederle M.; Fauler A.; Chelkov G.; Toblanov O.; Tyazhev A.; Visser J.
| 2011 IEEE Nuclear Science Symposium Conference Record, Pages: 4715 - 4719, doi: 10.1109/NSSMIC.2011.6154765
| 2011
|
|
| X-ray based methods for 3D characterization of charge collection and homogeneity of sensors with the use of Timepix chip
| Žemlička J.
; Jakůbek J.
; Jakůbek M.
; Vykydal Z.
| 2011 IEEE Nuclear Science Symposium Conference Record, Pages: 4711 - 4713, doi: 10.1109/NSSMIC.2011.6154764
| 2011
|
|
| Energy sensitive X-ray radiography for the non-destructive inspection of historical paintings
| Žemlička J.
; Jakůbek J.
; Kroupa M.
; Hradil D.; Hradilová J.; Mislerová H.
| Acta Artis Academica: Příběh umění - Proměny výtvarného díla v čase, s. 339-350, ISBN 978-80-87108-14-7
| 2010
|
|
| Evaluation of the ATLAS-MPX Devices for Neutron
Field Spectral Composition Measurement in the
ATLAS Experiment
| Vykydal Z.
; Bouchami J.; Campbell M.; Doležal Z.; Fiederle M.; Greiffenberg D.; Gutierrez A.; Heijne E.; Holý T.
; Idarraga J.; Jakůbek J.
; Král V.
; Králík M.; Lebel C.; Leroy C.; Llopart X.; Maneuski D.; Nessi M.; O/'Shea V.; Platkevič M.
; Pospíšil S.
; Sochor V.; Šolc J.
; Suk M.; Tlustos L.; Vichoudis P.; Visschers J.; Wilhelm I.; Žemlička J.
| 2008 IEEE Nuclear Science Symposium Conference Record, Pages: 1628-1632, doi: 10.1109/NSSMIC.2008.4774829
| 2009
|
|
| Network of Radiation Detectors for ATLAS
| Žemlička J.
; Vykydal Z.
; Jakůbek J.
; Holý T.
| Proceedings of Workshop 2008, CTU in Prague, Volume: 12, Pages: 82-83, ISBN 978-80-01-04016-4
| 2008
|