Multilayer semiconductor strip detector with analogue readout
Tomas Slavicek
IEAP CTU in Prague (CR)
Abstract: In collaboration project between Czech and Norwegian partners we developed a system capable of coincidence measurement of analogue signals originating in multilayer silicon strip detector. The multilayer silicon detector is capable of detection of charged particles, photons and neutrons. Evolution of the system from discrete parts to final demonstrators will be shown as well as results of the continuous characterisation.
Seminar takes place on Tuesday, October 10th 2017 at 2:00 PM
in the IEAP meeting room, Praha 2 ‐ Albertov, Horská 3a/22.
| Dr. André Sopczak seminar organizer |
doc. Ing. Ivan Štekl, CSc. headmaster |
Dr. André Sopczak IEEE CS - NPSS chair |
NUCLEAR & PLASMA SCIENCES SOCIETY CHAPTER
IEEE Czechoslovakia section
http://www.ieee.cz/en/nps