ÚTEF - Ústav technické a experimentální fyziky ČVUT - České vysoké učení technické v Praze
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ÚTEF - Ústav technické a experimentální fyziky ČVUT - České vysoké učení technické v Praze
ČVUT - České vysoké učení technické v Praze
Publikace  > Články v impaktovaných časopisech  > 'X-ray beam hardening based material recognition in micro-imaging'
X-ray beam hardening based material recognition in micro-imaging

Autor

Rok
2011

Časopis
JINST 6 P08015 doi:10.1088/1748-0221/6/08/P08015

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Obsah
We are developing a technique of X-ray imaging capable of identifying materials in the image. The presented technique is based on analysis of two or more images taken using different energy discrimination thresholds with a single photon counting imaging detector, Medipix2. The Medipix type detectors are devices suitable for material resolving imaging thanks to their energy sensitivity for individual photons, allowing transmission to be measured as a function of X-ray energy. The material recognition technique presented here uses the signal-to-thickness calibration method and can be applied to images collected with an X-ray tube without the use of filters.
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Příklad citace článku:
J. Uher, J. Jakůbek, S. Mayo, A. Stevenson, J. Tickner, "X-ray beam hardening based material recognition in micro-imaging", JINST 6 P08015 doi:10.1088/1748-0221/6/08/P08015 (2011)

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