Sub-micron resolution CT with large-area photon counting detector Timepix
Jan Dudak
IEAP CTU in Prague
Abstract: As X-ray micro-CT became a popular tool for scientific purposes a number of commercially available CT systems have emerged on the market. Micro-CT systems have, therefore, become widely accessible and the number of research laboratories using them constantly increases. However, even when CT scans with spatial resolution of several micrometers can be performed routinely, data acquisition with sub-micron precision remains a complicated task. Issues come mostly from prolongation of the scan time inevitably connected with the use of nano-focus X-ray sources. Long exposure time increases the noise level in the CT projections. Furthermore, considering the sub-micron resolution even effects like source-spot drift, rotation stage wobble or thermal expansion become significant and can negatively affect the data. The use of dark-current free photon counting detectors as X-ray cameras for such applications can limit the issue of increased image noise in the data, however the mechanical stability of the whole system still remains a problem and has to be considered. In this work we evaluate the performance of a custom-built micro-CT system equipped with nano-focus X-ray tube and a large area photon counting detector Timepix for scans with effective pixel size bellow one micrometer.
Seminar takes place on Tuesday, January 9th 2018 at 2:00 PM
in the IEAP meeting room, Praha 2 ‐ Albertov, Horská 3a/22.
| doc. Dr. André Sopczak seminar organizer |
doc. Ing. Ivan Štekl, CSc. headmaster |
doc. Dr. André Sopczak IEEE CS - NPSS chair |
NUCLEAR & PLASMA SCIENCES SOCIETY CHAPTER
IEEE Czechoslovakia section
http://www.ieee.cz/en/nps