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The Characterization of CdTe TimePix Device and the Study of its Capabilities for the Double Beta Decay Measurements

Autor

Čermák Pavel, Ing., Ph.D.	UTEF
Štekl Ivan, Doc. Ing. CSc.	UTEF
Bočarov Viktor, Ing.	UTEF
Jakůbek Jan, Ing. Ph.D.	UTEF
Pospíšil Stanislav, Ing. DrSc.	UTEF
Fiederle Michael, Dr.	FMF University of Freiburg
Zuber K	Institut für Kern- und Teilchenphysik, Technische Universität Dresden, Germany

Rok

2008

Časopis

IEEE NSS/MIC/RTSD Conf. Proc.

Web

http://www.nss-mic.org/2008/NSSMain.asp

Obsah

This work aims at the characterization of cadmiumtelluride detector bump-bonded on the TimePix readout chip and the evaluation of its potential as a tool to study the double beta decay (bb) processes (such as b−b− or EC/EC), typically performed in ultra low background conditions. First tests with the CdTe pixelated sensor (256×256 pixel matrix, 55μm pitch, 1mm sensor thickness) have been performed. The results of the device calibration and testing of the spectroscopic properties as well as the estimation of intrinsic background of the device are presented.

Příklad citace článku:

P. Čermák, I. Štekl, V. Bočarov, J. Jakůbek, S. Pospíšil, M. Fiederle, K. Zuber, "The Characterization of CdTe TimePix Device and the Study of its Capabilities for the Double Beta Decay Measurements", IEEE NSS/MIC/RTSD Conf. Proc. (2008)

Hledat

Události

Experimental physics with polarized protons, neutrons and deuterons