ÚTEF - Ústav technické a experimentální fyziky ČVUT - České vysoké učení technické v Praze
Česky English
ÚTEF - Ústav technické a experimentální fyziky ČVUT - České vysoké učení technické v Praze
ČVUT - České vysoké učení technické v Praze
Publikace  > Příspěvky ve sbornících konferencí  > 'Non-contact Electron optics System for Coincidence Imaging analysis'
Non-contact Electron optics System for Coincidence Imaging analysis

Autor

Rok
2010

Časopis
11th ICATPP Conference, Villa Olmo - Como (Italy), 5-9 October 2009, ISBN 10 981-4307-51-2, pp. 631 – 635

Web


Obsah
An electron imaging system has been developed for spatial information in coincidence Instrumental Neutron Activation Analysis. In our technique, a beta-radioactive sample is scanned at once where the electrons are detected in the position-sensitive Timepix detector in coincidence with γ-rays. Following our previous work where the detector was used in close-contact sample geometry, we have built a devoted non-contact electron optic system to focus coincidence electrons for imaging measurements with enhanced spatial resolution and reduced blurring. This contribution describes the electron focusing system and its evaluation

Příklad citace článku:
M. Kroupa, J. Jakůbek, F. Krejčí, "Non-contact Electron optics System for Coincidence Imaging analysis", 11th ICATPP Conference, Villa Olmo - Como (Italy), 5-9 October 2009, ISBN 10 981-4307-51-2, pp. 631 – 635 (2010)

Hledat
10th Anniversary of IEAP