The hybrid semiconductor pixel detector Timepix operated in the Time-over-Threshold mode (ToT) enables direct energy measurement in each pixel. The advantage of noiseless position sensitive detection combined with per pixel spectroscopic capability opens the way to numerous new applications, which were till now, however, restricted to detection of radiation which is basically above the detector energy threshold (typically 3 – 4 keV). This limitation excludes application of the hybrid pixel technology to highly interesting fields such as plasma diagnostics or X-ray microscopy. In this contribution we demonstrate how the Timepix detector working in ToT mode can be operated as a detector for particles which are in principle below the detector threshold, namely for soft X-ray photons with energy typically 0.5 keV. The approach is based on the detection of a larger number of photons incoming in the pixel signal processing chain in a time significantly shorter than the shaping time of the pixel electronics, i.e. forming signal pile-up. The proposed approach enables a CCD-like integrating operation with the many advantages of the hybrid counting technology (direct conversion, high sensitivity, dark-current free, room temperature operation, fully digital output and possibility to utilize various read-out architectures). Using the proposed approach we performed single-shot X-ray radiography with a laser-induced plasma source in the spectral region of water window. The same technique was used for the characterization of the source itself.