ÚTEF - Ústav technické a experimentální fyziky ČVUT - České vysoké učení technické v Praze
Česky English
ÚTEF - Ústav technické a experimentální fyziky ČVUT - České vysoké učení technické v Praze
ČVUT - České vysoké učení technické v Praze
Publikace  > 'X-ray Micro Radiography Using Beam Hardening Correction'
X-ray Micro Radiography Using Beam Hardening Correction

Autor

Rok
2005

Časopis
2005 IEEE Nuclear Science Symposium Conference Record, Pages: 2989-2992 , doi: 10.1109/NSSMIC.2005.1596959

Web


Obsah
The system presented provides high quality micro radiographs including very low contrast and low absorption objects. An important source of image distortion arises from beam hardening effects. When left uncorrected, distortion blurs low contrast image elements. Using a cooled digital X-ray semiconductor detector together with the proposed beam hardening correction procedure brings high dynamic range and very low noise of the acquired radiographs over the entire X ray source spectrum. Both soft and hard parts of the object appear with high contrast and spatial resolution in the resulting radiographs. The beam hardnenig correction procedure is fully automated using a set of the calibrators and appropriate software modules.
Granty

Projekty


Příklad citace článku:
D. Vavřík, T. Holý, J. Jakůbek, S. Pospíšil, Z. Vykydal, J. Dammer, "X-ray Micro Radiography Using Beam Hardening Correction", 2005 IEEE Nuclear Science Symposium Conference Record, Pages: 2989-2992 , doi: 10.1109/NSSMIC.2005.1596959 (2005)

Hledat
10th Anniversary of IEAP