X-ray polarimetry by means od Compton scattering in the sensor of a hybrid photon counting detector
Author
Year
2009
Scientific journal
NIMA Vol. 603, Issue 3, p. 384-392
Web
Abstract
For the first time a hybrid semiconductor photon counting pixel detector has been
used for measurements of linear X-ray polarization by exploiting the Compton effect
in the silicon sensor layer. The time-to-shutter mode of the X-ray imaging detector
Timepix was used to identify Compton scattering events in the sensor layer by the
analysis of coincidences. For irradiation with polarized X-ray photons of energies
between 27 and 84 keV we were able to measure a large modulation factor of μmeas =
(68.1±16.4) % for this type of X-ray polarimeter. Degree and orientation of linear
polarization can be determined. This publication describes experimental setup, data
analysis method, measurement and simulation results, and gives first estimations
Preprint submitted to Elsevier August 14, 2008
on the polarimetric performance for an application in X-ray astronomy.
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Cite article as:
T. Michel, J. Durst, J. Jakůbek, "X-ray polarimetry by means od Compton scattering in the sensor of a hybrid photon counting detector", NIMA Vol. 603, Issue 3, p. 384-392 (2009)