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> Use of material and electronic characteristic for basic tests of detectors and detector structures
Use of material and electronic characteristic for basic tests of detectors and detector structures
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Experimental physics
with polarized protons, neutrons and deuterons
Progressive detection methods in atomic and particle physics education at middle and high school level
NSS MIC IEEE ConferenceSeattle, USA
8-15 Nov 2014
SEPnet, CERN@school ConferenceSurrey, United Kingdom
Sep. 8, 2014
Lovci záhad - natáčení ČT ve spolupráci s ÚTEF
Advanced detection methods in atomic and subatomic physics education.April 24, 2014
Listening to the universe by detection cosmic rays - visit of French and Czech students3 Apr 2014
NSS MIC IEEE ConferenceSeoul, Korea
27 Oct - 2 Nov 2013
15thIWORIDParis
23-27 June 2013
NSS MIC IEEE Conference29 Oct - 3 Nov 2012
