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Background capabilities of pixel detectors for double beta decay measurements

Author

Čermák Pavel, Ing., Ph.D.	IEAP
Štekl Ivan, Doc. Ing. CSc.	IEAP
Bočarov Viktor, Ing.	IEAP
Jakůbek Jan, Ing. Ph.D.	IEAP
Pospíšil Stanislav, Ing. DrSc.	IEAP
Fiederle Michael, Dr.	FMF University of Freiburg
Fauler Alex	Freiburger Materialforschungszentrum, Albert-Ludwigs-Universität Freiburg, Germany
Zuber Kai	Institut für Kern - und Teilchenphysik, Technische Universität Dresden, Germany
Loaiza Pia	Laboratoire Souterrain de Modane, France
Shitov Yurij	Joint Institute for Nuclear Research, Dubna, Russia
Madathiparambil Jose Joshy, Ing.	IEAP

Year

2011

Scientific journal

NIM A

Web

http://dx.doi.org/10.1016/j.nima.2010.06.169

Abstract

We discuss the possible use of a progressive detection technique based on pixel detectors for the study of double beta decay processes. A series of background measurements in various environments (surface laboratory, underground laboratory, with and without Pb shielding) was performed using the TimePix silicon hybrid pixel device. The pixel detector response to the natural background and intrinsic background properties measured by a low-background HPGe detector are presented.

Grants

MSM 6840770029	Fundamental Experiments in the Physics of the Microworld
MSM 6840770040	Research Program 40: Usage of radionuclides and ionizing radiation.

Projects

Medipix

Cite article as:

P. Čermák, I. Štekl, V. Bočarov, J. Jakůbek, S. Pospíšil, M. Fiederle, A. Fauler, K. Zuber, P. Loaiza, Y. Shitov, J. Madathiparambil Jose, "Background capabilities of pixel detectors for double beta decay measurements", NIM A (2011)