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ÚTEF - Ústav technické a experimentální fyziky ČVUT - České vysoké učení technické v Praze
ČVUT - České vysoké učení technické v Praze
Publikace  > 'Microradiography with Semiconductor Pixel Detectors'
Microradiography with Semiconductor Pixel Detectors

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2007

Časopis
Amer. Inst. of Physics (AIP) Conf. Proc., Volume: 958, Pages: 131-135, doi: 10.1063/1.2825764

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Obsah
High resolution radiography (with X-rays, neutrons, heavy charged particles, …) often exploited also in tomographic mode to provide 3D images stands as a powerful imaging technique for instant and nondestructive visualization of fine internal structure of objects. Novel types of semiconductor single particle counting pixel detectors offer many advantages for radiation imaging: high detection efficiency, energy discrimination or direct energy measurement, noiseless digital integration (counting), high frame rate and virtually unlimited dynamic range. This article shows the application and potential of pixel detectors (such as Medipix2 or TimePix) in different fields of radiation imaging.
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Příklad citace článku:
J. Jakůbek, A. Cejnarová, J. Dammer, T. Holý, M. Platkevič, S. Pospíšil, D. Vavřík, Z. Vykydal, "Microradiography with Semiconductor Pixel Detectors", Amer. Inst. of Physics (AIP) Conf. Proc., Volume: 958, Pages: 131-135, doi: 10.1063/1.2825764 (2007)

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