Publikace
> 'Fast Spectroscopic Imaging
with Pixel Semiconductor Detector Timepix
and Parallel Data Reading'
Fast Spectroscopic Imaging
with Pixel Semiconductor Detector Timepix
and Parallel Data Reading
Autor
Rok
2014
Časopis
Journal of Instrumentation
Web
Obsah
Non-invasive techniques utilizing X-ray radiation offer a powerful tool for the inspection
of the inner composition of a wide variety of objects. The highly sensitive hybrid semiconductor
pixel detector Timepix is capable of detecting and resolving subtle and low-contrast differences
in radiography measurements.
Moreover the Timepix detector offers 65536 individual pixels with spectrometric capabilities. With
proper per-pixel energy calibration this feature enables the application of various energy based
imaging techniques - from basic energy windowing to fully spectroscopic imaging. The main limitations
of these methods are the detector energy resolution and data acquisition speed of 100 frames
per second - the necessity of taking frames with low occupancy for event by event cluster analysis
leads to several hours long measurements.
The latter nuisance can be overcome by the utilization of the newly developed modular read-out
FITPix3 with the adapter chipboard designed for parallel data reading. This read-out version can
acquire over 850 compressed frames per second which reduces the measurement time of many
spectroscopic measurements by factor of ten (spectra with high enough statistics are taken in tens
of minutes).
The short description of the new FITPix3 parallel read-out together with the progression in spectroscopic
multi-channel energy imaging demonstrated on model samples are presented in this contribution.
Granty
Příklad citace článku:
J. Žemlička, M. Holík, V. Kraus, J. Jakůbek, "Fast Spectroscopic Imaging
with Pixel Semiconductor Detector Timepix
and Parallel Data Reading", Journal of Instrumentation (2014)