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ÚTEF - Ústav technické a experimentální fyziky ČVUT - České vysoké učení technické v Praze
ČVUT - České vysoké učení technické v Praze
Publikace  > Články v impaktovaných časopisech  > 'Characterization of 3D thermal neutron semiconductor detectors'
Characterization of 3D thermal neutron semiconductor detectors

Autor
Uher Josef, Ing. UTEF
Jakůbek Jan, Ing. PhD. UTEF
Kohout Zdeněk, Ing. PhD. UTEF
Linhart Vladimir, Ing. Ph.D. UTEF
Pospíšil Stanislav, DrSc. Ing. UTEF
Fröjd C. Faculty of Science, Technology and Media, Mid-Sweden University, 851 70 Sundsvall, Sweden
Petersson S. Faculty of Science, Technology and Media, Mid-Sweden University, 851 70 Sundsvall, Sweden
Kenney Chris MBC, Stanford Nanofabrication Facility, 420 Via Palou Mall, Stanford University, CA 94305, USA
Parker Sherwood University of Hawaii, 874 Dillingham Blvd, Honolulu, HI 96817, USA
Thungstrom Goran MSU Sundsvall

Rok
2007

Časopis
NIM A 576 (2007) 32-37

Web


Obsah
Neutron semiconductor detectors for neutron counting and neutron radiography have an increasing importance. Simple silicon neutron detectors are combination of a planar diode with a layer of an appropriate neutron converter such as 6LiF. These devices have limited detection efficiency of not more than 5%. The detection efficiency can be increased by creating a 3D microstructure of dips, trenches or pores in the detector and filling it with a neutron converter. The first results related to the development of such devices are presented. Silicon detectors were fabricated with pyramidal dips on the surface covered with 6LiF and then irradiated by thermal neutrons. Pulse height spectra of the energy deposited in the sensitive volume were compared with simulations. The detection efficiency of these devices was about 6.3%. Samples with different column sizes were fabricated to study the electrical properties of 3D structures. Charge collection efficiencies in silicon columns from 10 to 800 μm wide and 80–200 μm high were measured with alpha particles. The neutron detection efficiency of a full 3D structure was simulated. The results indicate an increase in detection efficiency by a factor of 6 in comparison with a standard planar neutron detector.
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Příklad citace článku:
J. Uher, J. Jakůbek, Z. Kohout, V. Linhart, S. Pospíšil, C. Fröjd, S. Petersson, C. Kenney, S. Parker, G. Thungstrom, "Characterization of 3D thermal neutron semiconductor detectors", NIM A 576 (2007) 32-37 (2007)

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