X-ray diffractometry with pixel detector MEDIPIX at PANanalytical
Dr. Klaus Bethke a Dr. Roelof de Vires
PHILIPS PANanalytical, Nizozemsko
Abstract:
Seminar takes place on Wednesday, February 22nd 2006 at 2:00 PM
NUCLEAR & PLASMA SCIENCES SOCIETY CHAPTER
IEEE Czechoslovakia section
http://www.ieee.cz/en/nps